• DocumentCode
    1297713
  • Title

    An improved sliding-load calibration procedure using a semiparametric circle-fitting procedure

  • Author

    Vandersteen, Gerd ; Rolain, Yves ; Schoukens, Johan ; Verschueren, Ann

  • Author_Institution
    Vrije Univ., Brussels, Belgium
  • Volume
    45
  • Issue
    7
  • fYear
    1997
  • fDate
    7/1/1997 12:00:00 AM
  • Firstpage
    1027
  • Lastpage
    1033
  • Abstract
    Circle-fitting problems often occur in microwave engineering when dealing with variable delays, e.g., during calibration using a sliding load. This paper proposes an efficient semiparametric circle-fitting procedure, which takes into account the phase relationships over the frequencies. It produces more accurate results than the standard sliding-load calibration, requires only three positions on the sliding load for the whole frequency band, and is more robust to the settings of the positions of the sliding load. The proposed method also has the ability to detect whether or not the sliding load is defective or out of its specifications. This can be done by using only three positions on the sliding load. Optimal-position settings are then proposed. The performance of the proposed method is illustrated on sliding-load measurements up to 50 GHz, demonstrating the ability of detecting modeling errors and showing that the accuracy of the proposed method using three positions is comparable to the standard method with six positions
  • Keywords
    calibration; delays; measurement errors; microwave measurement; millimetre wave measurement; network analysers; 50 GHz; modeling errors detection; optimal-position settings; phase relationships; semiparametric circle-fitting procedure; sliding-load calibration procedure; variable delays; Calibration; Delay; Frequency dependence; Frequency measurement; Impedance measurement; Measurement standards; Parametric statistics; Position measurement; Reflection; Transmission line measurements;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.598437
  • Filename
    598437