Pure-mode network analyzer for on-wafer measurements of mixed-mode S-parameters of differential circuits

Author

Bockelman, David E. ; Eisenstadt, William R.

Author_Institution

Motorola Radio Products Appl. Res., Plantation, FL, USA

Volume

45

Issue

7

fYear

1997

fDate

7/1/1997 12:00:00 AM

Firstpage

1071

Lastpage

1077

Abstract

A practical measurement system is introduced for measurement of combined differential and common-mode (mixed-mode) scattering parameters, and its operation is discussed. A pure-mode system measures network parameters of a differential circuit in the fundamental modes of operation, and has improved accuracy over a traditional network analyzer for the measurement of such circuits. The system is suitable for on-wafer measurements of differential circuits. The transformation between standard S-parameters and mixed-mode S-parameters is developed. Example microwave differential structures are measured with the pure-mode vector-network analyzer (PMVNA), and the corrected data is presented. These structures are simulated, and the simulated mixed-mode S-parameters correlate well with the measured data

Keywords

MMIC; S-parameters; UHF integrated circuits; UHF measurement; integrated circuit testing; microwave measurement; multiport networks; network analysers; differential circuits; fundamental modes; microwave differential structures; mixed-mode S-parameters; on-wafer measurements; pure-mode VNA; pure-mode network analyzer; scattering parameters; vector network analyzer; Circuit simulation; Circuit testing; Frequency measurement; Integrated circuit measurements; Integrated circuit testing; Microwave circuits; Microwave measurements; Scattering parameters; Standards development; Voltage;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.598443

Filename

598443