DocumentCode :
129783
Title :
Improved lateral resolution and contrast in ultrasound imaging using a sidelobe masking technique
Author :
Savoia, Alessandro Stuart ; Caliano, G. ; Matrone, Giulia ; Magenes, G. ; Ramalli, Alessandro ; Boni, Enrico ; Tortoli, Piero
Author_Institution :
Dipt. di Ing., Univ. degli Studi Roma Tre, Rome, Italy
fYear :
2014
fDate :
3-6 Sept. 2014
Firstpage :
1682
Lastpage :
1685
Abstract :
In this paper, we propose a method to improve the lateral resolution and the contrast of ultrasound images, based on the cancellation of the sole contribution due to the sidelobes, thus maintaining the original depth of field and penetration capability. In the proposed method, each scan line is obtained by compounding the signals reconstructed by two emissions. For the first one, typical aperture and apodization profile are adopted. In the second emission, the same aperture is used, but the sign of the apodization profile is inverted over the second half of the aperture. The same approach is applied in receive. In this way, the second two-way beam has a main lobe with near-zero amplitude and sidelobes close to those of the first beam. The RF echo-signals corresponding to the two emissions are demodulated and successively subtracted. The resulting signal is finally log-compressed and scan converted. Simulations and in vivo experiments show a significant improvement of both detail and contrast resolution.
Keywords :
acoustic signal processing; image reconstruction; image resolution; ultrasonic imaging; RF echo-signals; apodization profile; in vivo experiments; lateral resolution; log-compressed signal; scan line; sidelobe masking technique; signal reconstruction; two-way beam; ultrasound image contrast; ultrasound imaging; Apertures; Array signal processing; Image resolution; Imaging; Radio frequency; Signal resolution; Ultrasonic imaging; beamforming; contrast; resolution; sidelobe masking; sidelobe reduction; ultrasound imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium (IUS), 2014 IEEE International
Conference_Location :
Chicago, IL
Type :
conf
DOI :
10.1109/ULTSYM.2014.0417
Filename :
6932241
Link To Document :
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