• DocumentCode
    1298153
  • Title

    Behavioral modeling of microelectromechanical systems (MEMS) with statistical performance-variability reduction and sensitivity analysis

  • Author

    Dewey, Allen ; Ren, Hong ; Zhang, Tianhao

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
  • Volume
    47
  • Issue
    2
  • fYear
    2000
  • fDate
    2/1/2000 12:00:00 AM
  • Firstpage
    105
  • Lastpage
    113
  • Abstract
    An approach to behavioral modeling of microelectromechanical systems (MEMS) is presented emphasizing robust design that minimizes the effects of device parametric variability on overall performance. Using a novel application of Taguchi experimental design and statistical process-control methods, statistical performance-variability reduction and parametric sensitivity analysis are studied. Taguchi performance-variability reduction and parametric sensitivity analyses introduce design-for-manufacturing into behavioral modeling. An example is given for the robust behavioral modeling of a microelectromechanical laterally driven electrostatic-comb microresonator. Applications of the behavioral-modeling approach to high-performance design, manufacturing yield optimization, and operational reliability assessment are also given
  • Keywords
    design for manufacture; design of experiments; micromechanical devices; micromechanical resonators; sensitivity analysis; statistical process control; Taguchi experimental design; behavioral model; design for manufacturing; electrostatic comb microresonator; manufacturing yield optimization; microelectromechanical system; operational reliability; parametric sensitivity analysis; robust design; statistical performance variability; statistical process control; Design for experiments; Design optimization; Fabrication; Integrated circuit yield; Manufacturing; Microelectromechanical systems; Microelectronics; Micromechanical devices; Robustness; Sensitivity analysis;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7130
  • Type

    jour

  • DOI
    10.1109/82.821550
  • Filename
    821550