DocumentCode
1298153
Title
Behavioral modeling of microelectromechanical systems (MEMS) with statistical performance-variability reduction and sensitivity analysis
Author
Dewey, Allen ; Ren, Hong ; Zhang, Tianhao
Author_Institution
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
Volume
47
Issue
2
fYear
2000
fDate
2/1/2000 12:00:00 AM
Firstpage
105
Lastpage
113
Abstract
An approach to behavioral modeling of microelectromechanical systems (MEMS) is presented emphasizing robust design that minimizes the effects of device parametric variability on overall performance. Using a novel application of Taguchi experimental design and statistical process-control methods, statistical performance-variability reduction and parametric sensitivity analysis are studied. Taguchi performance-variability reduction and parametric sensitivity analyses introduce design-for-manufacturing into behavioral modeling. An example is given for the robust behavioral modeling of a microelectromechanical laterally driven electrostatic-comb microresonator. Applications of the behavioral-modeling approach to high-performance design, manufacturing yield optimization, and operational reliability assessment are also given
Keywords
design for manufacture; design of experiments; micromechanical devices; micromechanical resonators; sensitivity analysis; statistical process control; Taguchi experimental design; behavioral model; design for manufacturing; electrostatic comb microresonator; manufacturing yield optimization; microelectromechanical system; operational reliability; parametric sensitivity analysis; robust design; statistical performance variability; statistical process control; Design for experiments; Design optimization; Fabrication; Integrated circuit yield; Manufacturing; Microelectromechanical systems; Microelectronics; Micromechanical devices; Robustness; Sensitivity analysis;
fLanguage
English
Journal_Title
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
Publisher
ieee
ISSN
1057-7130
Type
jour
DOI
10.1109/82.821550
Filename
821550
Link To Document