Title :
Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing
Author :
Berg, Melanie D. ; Buchner, Stephen P. ; Kim, Hak ; Friendlich, Mark ; Perez, Christopher ; Phan, Anthony M. ; Seidleck, Christina M. ; LaBel, Kenneth A. ; Kruckmeyer, Kirby
Author_Institution :
MEI Technol., Inc., Greenbelt, MD, USA
Abstract :
A novel approach to dynamic SEE ADC testing is presented. The benefits of this test scheme versus prior implemented techniques include the ability to observe ADC SEE errors that are in the form of phase shifts, single bit upsets, bursts of disrupted signal composition, and device clock loss.
Keywords :
analogue-digital conversion; semiconductor device testing; analog-to-digital device testing; device clock loss; dynamic SEE ADC testing; error signature; signal composition; Clocks; Field programmable gate arrays; Instruments; NASA; Noise; Observability; Radiation effects; Single event upset; Synchronization; Testing; Vehicle dynamics; Vehicles; ADC; FPGA; SEE; dynamic;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2052068
