DocumentCode :
1298348
Title :
A 96% Efficient High-Frequency DC–DC Converter Using E-Mode GaN DHFETs on Si
Author :
Das, Joydeep ; Everts, Jordi ; Van den Keybus, Jeroen ; Van Hove, Marleen ; Visalli, D. ; Srivastava, Prashant ; Marcon, Denis ; Kai Cheng ; Leys, M. ; Decoutere, Stefaan ; Driesen, Johan ; Borghs, G.
Author_Institution :
Interuniv. Microelectron. Center (IMEC), Leuven, Belgium
Volume :
32
Issue :
10
fYear :
2011
Firstpage :
1370
Lastpage :
1372
Abstract :
III-Nitride materials are very promising to be used in next-generation high-frequency power switching applications. In this letter, we demonstrate the performance of normally off AlGaN/GaN/AlGaN double-heterostructure FETs (DHFETs) using a boost-converter circuit. The figures of merit of our large (57.6-mm gate width) GaN transistor are presented: RON * QG of 2.5 Ω·nC is obtained at VDS = 140 V. The switching performance of the GaN DHFET is studied in a dedicated high-frequency boost converter: both the switching times and power losses are characterized. We show converter efficiency values up to 96.1% at 500 kHz and 93.9% at 850 kHz at output power of 100 W.
Keywords :
DC-DC power convertors; III-V semiconductors; aluminium compounds; gallium compounds; power field effect transistors; switching convertors; wide band gap semiconductors; AlGaN-GaN-AlGaN; E-mode DHFET; III-nitride materials; Si; boost converter circuit; double-heterostructure FET; frequency 500 kHz; frequency 850 kHz; high-frequency DC-DC converter; high-frequency boost converter; next-generation high-frequency power switching applications; power 100 W; power loss; switching times; voltage 140 V; Aluminum gallium nitride; DH-HEMTs; Gallium nitride; Logic gates; Silicon; Switches; Voltage measurement; Converters; GaN; SPICE; efficiency; high voltage; power field-effect transistors (FETs);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2011.2162393
Filename :
5985468
Link To Document :
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