• DocumentCode
    129840
  • Title

    Theoretical and experimental investigation of Lamb waves characteristics in AlN/TiN and AlN/TiN/NCD composite membranes

  • Author

    Soltani, Ali ; Talbi, A. ; Gerbedoen, J.-C. ; De Jaeger, J.-C. ; Pernod, Philippe ; Mortet, V. ; Bassam, A.

  • Author_Institution
    IEMN, Univ. of Lille, Villeneuve-d´Ascq, France
  • fYear
    2014
  • fDate
    3-6 Sept. 2014
  • Firstpage
    2047
  • Lastpage
    2050
  • Abstract
    In this study, we present a theoretical and experimental investigations of the zero order quasi-symmetric (S0) Lamb waves mode propagating in AlN/TiN and AlN/TiN/NCD composite membranes. Theoretical analysis of S0 mode characteristics shows that The AlN/TiN membrane enables to achieve smooth dispersion curves, high velocity up to 10000m/s and electromechanical coupling coefficient K2 up to 3.5%. Thanks to the excellent mechanical properties of the Nano-Crystalline Diamond (NCD), the AlN/TiN/NCD membrane exhibits excellent acoustic wave properties: acoustic wave velocity more than 12000m/s for diamond film thickness less than 1μm. An intrinsic K2 coefficient up to 5% can be reached for in the zone of maximum phase velocity dispersion. These characteristic can be of great interest for sensors applications. From the experimental point of view, a highly oriented c-axis Aluminum Nitride thin films were successfully grown on metallic TiN buffer layer by low temperature sputtering deposition. One important factor in controlling the quality of AlN was the growth of cubic TiN with (111) as preferential crystal orientation. Different acoustic lamb waves devices were fabricated and characterized confirming the very good piezoelectric activity of the AlN. For the case of AlN/TiN/NCD, the addition of the NCD thin films enhances drastically the mechanical toughness of the structure compared to AlN/TiN membrane.
  • Keywords
    acoustic wave velocity; aluminium compounds; buffer layers; membranes; sputter deposition; surface acoustic waves; titanium compounds; AlN-TiN; Lamb waves; acoustic wave velocity; aluminum nitride thin films; buffer layer; composite membranes; dispersion curves; electromechanical coupling coefficient; low temperature sputtering deposition; Acoustic waves; Annealing; Diamonds; Dispersion; III-V semiconductor materials; Tin; AlN; Lamb waves; TiN; composite membrane; diamond;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2014 IEEE International
  • Conference_Location
    Chicago, IL
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2014.0510
  • Filename
    6932298