DocumentCode :
1298480
Title :
IASTED conference on reliability and quality control
Author :
Dhillon, B.
Author_Institution :
Department of Mechanical Engineering, University of Ottawa, Ottawa, Ont. K1N 6N5, Canada
Issue :
11
fYear :
1986
Firstpage :
1104
Lastpage :
1104
Abstract :
THE International Association of Science and Technology for Development (IASTED) Conference on Reliability and Quality Control is to be held at the Palais des Congres in Paris, France.
Keywords :
Analytical models; Power system reliability; Predictive models; Quality control; Software; Software reliability;
fLanguage :
English
Journal_Title :
Software Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-5589
Type :
jour
DOI :
10.1109/TSE.1986.6313003
Filename :
6313003
Link To Document :
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