• DocumentCode
    12989
  • Title

    Electron Microscopy Study on Magnetic Flux Lines in Superconductors: Memorial to Akira Tonomura

  • Author

    Harada, Kanako ; Osakabe, N. ; Ono, Y.A.

  • Author_Institution
    Hitachi Central Res. Lab., Hatoyama, Japan
  • Volume
    23
  • Issue
    1
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    8000507
  • Lastpage
    8000507
  • Abstract
    Using electron holography and coherent beam Lorentz microscopy, Akira Tonomura investigated the physics of magnetic flux lines, or vortices, in metal and high-temperature superconductors for more than 20 years. The methodology he developed for doing this made use of coherent electron waves from cold-emission (field-emission) sources and their quantum-mechanical phase shifts. Using 300-kV and 1-MV electron microscopes, Tonomura and his team clarified the dynamic behavior of magnetic flux lines in Pb and Nb superconductors and in high-temperature YBa2Cu3O7-δ and Bi2Sr2CaCu2O8 + δ superconductors. This memorial paper reviews the static and dynamic flux-line behaviors in superconductors as revealed by their results.
  • Keywords
    barium compounds; bismuth compounds; calcium compounds; electron holography; field emission electron microscopy; high-temperature superconductors; lead; magnetic flux; niobium; optical vortices; strontium compounds; yttrium compounds; Akira Tonomura; Bi2Sr2CaCu2O8+δ; Nb; Pb; YBa2Cu3O7-δ; coherent beam Lorentz microscopy; coherent electron wave; cold-emission source; electron holography; electron microscopy study; field-emission source; high-temperature superconductor; magnetic flux line; metal superconductor; quantum-mechanical phase shift; voltage 1 MV; voltage 300 kV; vortices; Electron microscopy; Magnetic domains; Magnetic flux; Magnetic force microscopy; Magnetic resonance imaging; Superconducting magnets; Electron holography; Lorentz microscopy; electron microscopy; magnetic flux lines; superconductivity; vortex;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2012.2232924
  • Filename
    6412811