Title :
Using FLIPPER to Predict Proton Irradiation Results for VIRTEX 2 Devices: A Case Study
Author :
Alderighi, Monica ; Casini, Fabio ; Citterio, Mauro ; D´Angelo, Sergio ; Mancini, Marcello ; Pastore, Sandro ; Sechi, Giacomo R. ; Sorrenti, Gabriele
Author_Institution :
Ist. di Astrofis. Spaziale e Fis. Cosmica, Ist. Naz. di Astrofis., Milan, Italy
Abstract :
The paper describes how FLIPPER can be used to analyze the SEU sensitivity of designs implemented by means of SRAM-based FPGAs by both fault injection and radiation testing. The comparison between fault injection experiment and proton testing on selected designs is presented in the paper. The excellent agreement represents a significant achievement toward the FLIPPER validation.
Keywords :
SRAM chips; field programmable gate arrays; proton effects; semiconductor device testing; FLIPPER; SEU sensitivity; SRAM-based FPGAs; fault injection; proton irradiation; radiation testing; single event upsets; virtex-2 devices; Circuit faults; Circuit testing; Field programmable gate arrays; Flip-flops; Ionization; Programmable logic arrays; Protons; Random access memory; Read-write memory; Single event upset; Fault injection; field programmable gate array (FPGA); radiation ground testing; single event effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2015880
