DocumentCode :
1299077
Title :
Fast Neutron Damage of a Pixelated CdZnTe Gamma Ray Spectrometer
Author :
Eisen, Yossi ; Shor, Asher
Author_Institution :
Soreq NRC, Yavne, Israel
Volume :
56
Issue :
4
fYear :
2009
Firstpage :
1700
Lastpage :
1705
Abstract :
This study describes the damage to a pixelated 1 cm times 1 cm times 1 cm CdZnTe detector caused by fast neutrons in the energy range 1-7 MeV. Measurements of electron mutau product were performed before and after irradiation and also following thermal annealing. Spectroscopic information was acquired with a 133Ba gamma source. Before neutron irradiation, sharp peaks were observed for the 133Ba lines, with combined pixel energy resolution for the 356 keV line of 2.1% FWHM. After irradiation, clear deterioration of the spectral response is observed, with combined energy resolution of the 356 keV line of about 6% FWHM. After thermal annealing, the spectral response shows significant recovery, with combined energy resolution of 2.3% FWHM. We successfully simulate these results with a theoretical model. It is concluded that the fast neutrons cause displacement damage in the lattice of the bulk CdZnTe material.
Keywords :
annealing; gamma-ray spectrometers; neutron effects; semiconductor counters; 133Ba gamma source; FWHM; electron volt energy 1 MeV to 7 MeV; fast neutron damage; neutron irradiation; pixelated gamma ray spectrometer; semiconductor detector; thermal annealing; Annealing; Electrons; Energy resolution; Gamma ray detection; Gamma ray detectors; Lattices; Neutrons; Performance evaluation; Protons; Spectroscopy; CdZnTe pixelated spectrometer; fast neutron damage; thermal annealing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2009.2020599
Filename :
5204580
Link To Document :
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