DocumentCode :
1299080
Title :
Measurements on commercial transistors
Author :
Hyde, F.J.
Volume :
4
Issue :
38
fYear :
1958
fDate :
2/1/1958 12:00:00 AM
Firstpage :
85
Lastpage :
86
Keywords :
characteristics measurement; transistors;
fLanguage :
English
Journal_Title :
Electrical Engineers, Journal of the Institution of
Publisher :
iet
Type :
jour
DOI :
10.1049/jiee-3.1958.0033
Filename :
5322331
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1299080
