• DocumentCode
    1299122
  • Title

    The effect of nonsinusoidal voltage on intrinsic aging of cable and capacitor insulating materials

  • Author

    Montanari, G.C. ; Fabiani, D.

  • Author_Institution
    Dept. of Electr. Eng., Bologna Univ., Italy
  • Volume
    6
  • Issue
    6
  • fYear
    1999
  • fDate
    12/1/1999 12:00:00 AM
  • Firstpage
    798
  • Lastpage
    802
  • Abstract
    This paper investigates the effect of nonsinusoidal voltage, i.e. voltage affected by the presence of harmonics, on intrinsic aging of cable and capacitor insulating materials, i.e. cross-linked polyethylene (XLPE) and polypropylene (PP). The results of life tests under sinusoidal and distorted voltage, the latter obtained superimposing one or more harmonics on the 50 Hz component, are processed by statistical techniques derived from design-of-experiment procedures. It is shown that the factor predominant on aging acceleration due to the voltage distortion is voltage-peak increase, but also waveform slope and voltage rms value have statistical significance. Life models are obtained for XLPE and PP insulating materials, which show the endurance of the two materials to aging under nonsinusoidal conditions
  • Keywords
    XLPE insulation; ageing; design of experiments; harmonics; insulation testing; life testing; plastics; power cable insulation; power capacitors; 50 Hz; cable insulating materials; capacitor insulating materials; cross-linked polyethylene; design-of-experiment procedures; endurance; harmonics; intrinsic aging; life tests; nonsinusoidal conditions; nonsinusoidal voltage; polypropylene; statistical techniques; voltage distortion; voltage rms value; voltage-peak increase; waveform slope; Aging; Analysis of variance; Breakdown voltage; Cable insulation; Capacitors; Dielectrics and electrical insulation; Harmonic distortion; Life testing; Partial discharges; Power system harmonics;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.822018
  • Filename
    822018