Title :
A characterization of t/s-diagnosability and sequential t-diagnosability in designs
Author :
Lee, Joo-kang ; Butler, Jon T.
Author_Institution :
Res. Inst. of Sci. & Technol., Pohang City, Kyungbuk, South Korea
fDate :
10/1/1990 12:00:00 AM
Abstract :
A multiprocessing system is t/s-diagnosable if all faulty processors can be identified to within s processors, provided there are no more than t faulty processors. A characterization theorem of S. Karunanithi and A.D. Friedman (1979) for t/s-diagnosability in certain special cases of systems called designs is extended to the entire class of D1,t´ (n) designs. It is shown that for large t, s is approximately t2/4t´. Furthermore, the minimum number of processors needed to attain a given diagnosability is derived. A multiprocessor system is sequentially t-diagnosable if at least one faulty processor can be identified provided there are no more than t faulty processors. A theorem by F. Preparata, G. Metze, and R. Chien (1967), giving a sufficient condition for sequential t-diagnosability in the single-loop system (a special case of designs), is extended to the entire class of D1,t´(n) designs. It is shown that, for large t, approximately t2/4t´ nodes are needed for a D1,t´ (n) design to be sequentially t-diagnosable
Keywords :
fault tolerant computing; multiprocessing systems; characterization theorem; designs; diagnosability; faulty processors; multiprocessing system; nodes; sequential t-diagnosability; single-loop system; sufficient condition; t/s-diagnosability; Cities and towns; Fault diagnosis; Multiprocessing systems; Sufficient conditions; System testing;
Journal_Title :
Computers, IEEE Transactions on