Title :
A distance measure between attributed relational graphs for pattern recognition
Author :
Sanfeliu, Alberto ; Fu, King-Sun
Author_Institution :
School of Electrical Engineering, Purdue University, West Lafayette, IN 47907; Instituto de Cibernètica, Barcelona, Spain
Abstract :
A method to determine a distance measure between two nonhierarchical attributed relational graphs is presented. In order to apply this distance measure, the graphs are characterised by descriptive graph grammars (DGG). The proposed distance measure is based on the computation of the minimum number of modifications required to transform an input graph into the reference one. Specifically, the distance measure is defined as the cost of recognition of nodes plus the number of transformations which include node insertion, node deletion, branch insertion, branch deletion, node label substitution and branch label substitution. The major difference between the proposed distance measure and the other ones is the consideration of the cost of recognition of nodes in the distance computation. In order to do this, the principal features of the nodes are described by one or several cost functions which are used to compute the similarity between the input nodes and the reference ones. Finally, an application of this distance measure to the recognition of lower case handwritten English characters is presented.
Keywords :
graph theory; pattern recognition; attributed relational graphs; descriptive graph grammars; distance measure; pattern recognition; Cost function; Grammar; Measurement uncertainty; Merging; Pattern recognition; Transforms;
Journal_Title :
Systems, Man and Cybernetics, IEEE Transactions on
DOI :
10.1109/TSMC.1983.6313167