Title :
Method of critical distances for stochastic assessment of voltage sags
Author_Institution :
Dept. of Electr. Power Eng., Chalmers Univ. of Technol., Goteborg, Sweden
fDate :
1/1/1998 12:00:00 AM
Abstract :
A fast method is presented for obtaining a first estimate of the expected number of spurious trips due to voltage sags. The method is based on an expression for the so-called critical distance (the radius of the exposed area in which faults lead to equipment trips) in radial power systems. Extensions of the method for nonradial systems, and transfer of sags due to single-phase and phase-to-phase faults to lower voltages are also presented
Keywords :
electrical faults; power systems; stochastic processes; critical distances method; nonradial systems; phase-to-phase faults; power system voltage sags; radial power systems; sags transfer; single-phase faults; spurious trips; stochastic assessment;
Journal_Title :
Generation, Transmission and Distribution, IEE Proceedings-
DOI :
10.1049/ip-gtd:19981739
