Analysis of CCD Dark Current Degradation in Orbit

Author

Penquer, Antoine ; Boutillier, Mathieu ; Rolland, Guy ; Gilard, Olivier ; Fougnie, Bertrand ; Porez, Florence

Author_Institution

Centre Nat. d´´Etudes Spatiales (CNES), Toulouse, France

Volume

56

Issue

4

fYear

2009

Firstpage

2142

Lastpage

2148

Abstract

This paper presents the CNES analysis of CCD dark current degradation in orbit. For the first time, data coming from several detectors in orbit have been collected and congregated to extract general trends about in-flight detector behaviours. The in-orbit degradation is therefore compared to the on-ground prediction for each detector. This work has been done in collaboration with the CNES detection subsystem office, the CNES image quality office and the CNES components & environment effects office.

Keywords

charge-coupled devices; gamma-ray detection; position sensitive particle detectors; radiation effects; semiconductor counters; CCD dark current degradation analysis; CNES components & environment effects office; CNES detection subsystem office; CNES image quality office; gamma ray detectors; in-flight detector behaviours; in-orbit degradation; pixel dark currents; radiation effects; Charge coupled devices; Collaborative work; Dark current; Data mining; Degradation; Detectors; Energy exchange; Image quality; Radiation effects; Space technology; CCD; DSNU; dark current; radiation damage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2009.2017744

Filename

5204645