DocumentCode
1299573
Title
Characterization and simulation of GaSb device-related properties
Author
Stollwerck, Gunther ; Sulima, Oleg V. ; Bett, Andreas W.
Author_Institution
Freiburg Mater. Res. Center, Germany
Volume
47
Issue
2
fYear
2000
fDate
2/1/2000 12:00:00 AM
Firstpage
448
Lastpage
457
Abstract
Device related parameters of GaSb are characterized and simulated based on measurements of photovoltaic cells. Internal quantum efficiencies are simulated to quantify the contributions from band-gap narrowing and the main recombination mechanisms, such as Auger, radiative, and Shockley-Read-Hall recombination. A detailed study of the recombination mechanisms values shows differences between literature data and data derived from comparison of simulation results with measurements on real devices. A new evaluation of these data is given. The evaluation of the band-gap narrowing in n-GaSb is performed by comparison of measurements and simulations of the injection component of the dark current I01 and open-circuit voltage. For the first time, a range of possible values for the intrinsic carrier concentration of GaSb at room temperature is given, based on theoretical calculations, and proven with comparison of measured lot and open-circuit voltages of GaSb photovoltaic devices
Keywords
Auger effect; III-V semiconductors; carrier density; carrier mobility; effective mass; electron-hole recombination; energy gap; gallium compounds; photovoltaic cells; semiconductor device measurement; semiconductor device models; Auger recombination; GaSb; GaSb device-related properties; Shockley-Read-Hall recombination; band-gap narrowing; characterization; dark current; injection component; internal quantum efficiencies; intrinsic carrier concentration; n-type GaSb; open-circuit voltage; photovoltaic cells; radiative recombination; recombination mechanisms; room temperature; simulation; Current measurement; Dark current; Performance evaluation; Photonic band gap; Photovoltaic cells; Photovoltaic systems; Radiative recombination; Temperature distribution; Time measurement; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.822293
Filename
822293
Link To Document