Title :
Characterization and simulation of GaSb device-related properties
Author :
Stollwerck, Gunther ; Sulima, Oleg V. ; Bett, Andreas W.
Author_Institution :
Freiburg Mater. Res. Center, Germany
fDate :
2/1/2000 12:00:00 AM
Abstract :
Device related parameters of GaSb are characterized and simulated based on measurements of photovoltaic cells. Internal quantum efficiencies are simulated to quantify the contributions from band-gap narrowing and the main recombination mechanisms, such as Auger, radiative, and Shockley-Read-Hall recombination. A detailed study of the recombination mechanisms values shows differences between literature data and data derived from comparison of simulation results with measurements on real devices. A new evaluation of these data is given. The evaluation of the band-gap narrowing in n-GaSb is performed by comparison of measurements and simulations of the injection component of the dark current I01 and open-circuit voltage. For the first time, a range of possible values for the intrinsic carrier concentration of GaSb at room temperature is given, based on theoretical calculations, and proven with comparison of measured lot and open-circuit voltages of GaSb photovoltaic devices
Keywords :
Auger effect; III-V semiconductors; carrier density; carrier mobility; effective mass; electron-hole recombination; energy gap; gallium compounds; photovoltaic cells; semiconductor device measurement; semiconductor device models; Auger recombination; GaSb; GaSb device-related properties; Shockley-Read-Hall recombination; band-gap narrowing; characterization; dark current; injection component; internal quantum efficiencies; intrinsic carrier concentration; n-type GaSb; open-circuit voltage; photovoltaic cells; radiative recombination; recombination mechanisms; room temperature; simulation; Current measurement; Dark current; Performance evaluation; Photonic band gap; Photovoltaic cells; Photovoltaic systems; Radiative recombination; Temperature distribution; Time measurement; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on