Hardness Assurance Test Guideline for Qualifying Devices for Use in Proton Environments

Author

Schwank, J.R. ; Shaneyfelt, M.R. ; Dodd, P.E. ; Felix, J.A. ; Baggio, J. ; Ferlet-Cavrois, V. ; Paillet, P. ; LaBel, K.A. ; Pease, R.L. ; Simons, M. ; Cohn, L.M.

Author_Institution

Sandia Nat. Labs., Albuquerque, NM, USA

Volume

56

Issue

4

fYear

2009

Firstpage

2171

Lastpage

2178

Abstract

Proton-induced single-event effects hardness assurance guidelines are developed to address issues raised by recent test results in advanced IC technologies for use in space environments. Specifically, guidelines are developed that address the effects of proton energy and angle of incidence on single-event latchup and the effects of total dose on single-event upset. The guidelines address both single-event upset (SEU), single-event latchup (SEL), and combined SEU and total ionizing dose (TID) effects.

Keywords

hardness testing; integrated circuit technology; integrated circuit testing; proton effects; IC technology; hardness assurance test guideline; proton energy; proton-induced single-event effects; single-event latchup; single-event upset; space environments; total ionizing dose effects; Circuit testing; Electronic equipment testing; Guidelines; Integrated circuit reliability; Integrated circuit testing; Ionization; Laboratories; Protons; Single event upset; Space technology; Integrated circuit reliability; integrated circuit testing; proton testing; radiation effects; radiation hardening (electronics); radiation response; single event effects; single event latchup; single event upset;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2009.2013239

Filename

5204662