DocumentCode :
1299740
Title :
Accelerated Irradiation Method to Study Synergy Effects in Bipolar Integrated Circuits
Author :
Roche, Nicolas Jean-Henri ; Velo, Yago Gonzalez ; Dusseau, Laurent ; Boch, Jérôme ; Vaillé, Jean-Roch ; Saigné, Frédéric ; Azais, Bruno ; Auriel, Gérard ; Lorfèvre, Eric ; Pouget, Vincent ; Buchner, Stephen P. ; David, Jean-Pierre ; Marec, Ronan ; Calvel,
Author_Institution :
IES, Univ. Montpellier II, Montpellier, France
Volume :
56
Issue :
4
fYear :
2009
Firstpage :
1971
Lastpage :
1977
Abstract :
An accelerated irradiation technique is used to study dose-ASET synergy effects. The impact of TID on SET is found to be identical when the dose rate is switched from high to low or from low to high.
Keywords :
bipolar integrated circuits; radiation effects; TID; accelerated irradiation method; bipolar integrated circuits; dose-ASET synergy effects; Acceleration; Analog integrated circuits; Bipolar integrated circuits; Circuit testing; Degradation; Integrated circuit technology; Integrated circuit testing; Laser beams; Pulse circuits; Pulsed laser deposition; Analog single event transient; bipolar analog integrated circuits; pulsed-laser testing; total ionizing dose;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2009.2015313
Filename :
5204685
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1299740
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