• DocumentCode
    1300012
  • Title

    Optimum array detector for a weak signal in unknown noise

  • Author

    Bose, Sandip ; Steinhardt, Allan O.

  • Author_Institution
    Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
  • Volume
    32
  • Issue
    3
  • fYear
    1996
  • fDate
    7/1/1996 12:00:00 AM
  • Firstpage
    911
  • Lastpage
    922
  • Abstract
    We study the design of constant false-alarm rate (CFAR) tests for detecting a rank-one signal in the presence of background Gaussian noise with unknown spatial covariance. We look at invariant tests, i.e., those tests whose performance is independent of the nuisance parameters, like the background noise covariance. Such tests are shown to have the desirable CFAR property. We characterize the class of all such tests by showing that any invariant decision statistic can be written as a function of two basic statistics which are in fact the adaptive matched filter (AMF) statistic and Kelly´s generalized likelihood ratio statistic. Further, we establish an optimum test in the limit of low signal-to-noise ratio (SNR), the locally most powerful invariant (LMPI) test. We also derive the bound for the probability of detection of any invariant detector, at a fixed false-alarm rate, and compare the LMPI and the published detectors (Kelly and AMF) to it.
  • Keywords
    Gaussian noise; array signal processing; matched filters; performance evaluation; probability; signal detection; statistical analysis; CFAR; Kelly´s generalized likelihood ratio statistic; LMPI; adaptive matched filter; background Gaussian noise; background noise covariance; constant false-alarm rate tests; fixed false-alarm rate; invariant decision statistic; invariant detector; nuisance parameters; optimum array detector; optimum test; probability; published detectors; rank-one signal; signal-to-noise ratio; unknown spatial covariance; weak signal; Background noise; Detectors; Gaussian noise; Matched filters; Sensor arrays; Signal design; Signal detection; Signal to noise ratio; Statistical analysis; Testing;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9251
  • Type

    jour

  • DOI
    10.1109/7.532252
  • Filename
    532252