DocumentCode :
1300078
Title :
Transient sensitivity computation in controlled explicit piecewise linear simulation
Author :
Nguyen, Tuyen V. ; Devgan, Anirudh ; Nastov, Ognen J. ; Winston, David W.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Volume :
19
Issue :
1
fYear :
2000
fDate :
1/1/2000 12:00:00 AM
Firstpage :
98
Lastpage :
110
Abstract :
This paper presents a general method for computing transient sensitivities using both direct and adjoint methods in controlled explicit event driven simulation algorithms that employ piecewise linear device models. Sensitivity information provides first order assessment of circuit variability with respect to design variables and parasitics. This information is particularly useful for noise analysis, timing rule generation, and circuit optimization. Techniques for incorporating transient sensitivity into adaptively controlled explicit simulation, a general piecewise linear simulator, are presented. Sensitivity computation includes algorithms to handle instantaneous charge redistribution due to the discontinuous conductance models of the piecewise linear elements, and the loss of simulation accuracy due to the nonmonotonic responses in autonomous adjoint circuits with nonzero initial conditions. Results demonstrate the efficiency and accuracy of the proposed techniques
Keywords :
circuit simulation; discrete event simulation; piecewise linear techniques; sensitivity analysis; transient analysis; adaptively controlled explicit simulation; adjoint method; circuit design; circuit optimization; direct method; event driven simulation algorithm; noise analysis; piecewise linear simulation; timing rule generation; transient sensitivity; Circuit noise; Circuit optimization; Circuit simulation; Computational modeling; Discrete event simulation; Noise generators; Piecewise linear techniques; Timing; Very large scale integration; Voltage;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.822623
Filename :
822623
Link To Document :
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