• DocumentCode
    1300090
  • Title

    Metal surface inspection using image processing techniques

  • Author

    Don, H.-S. ; Fu, K.-S. ; Liu, C.R. ; Lin, Wei-Cheng

  • Author_Institution
    School of Electrical Engng., Purdue Univ., West Lafayette, IN, USA
  • Issue
    1
  • fYear
    1984
  • Firstpage
    139
  • Lastpage
    146
  • Abstract
    The feasibility of applying image processing techniques to metal surface inspection is demonstrated. Two methods for metal surface inspection are described. In the first method, the metal surface reflective power and the metal surface normal are related by a random surface scattering model. The metal surface profile can then be computed from the metal surface normal. The second method applies pattern recognition techniques to classify metal surfaces into classes of different roughness. Methods of feature extraction and classification have been tested experimentally and the performances of different types of classifier have been compared. A two-level tree classifier using nonparametric linear classifiers at each node gives better than 90% correct classification on the testing set.
  • Keywords
    pattern recognition; picture processing; classification; feature extraction; image processing techniques; metal surface inspection; nonparametric linear classifiers; pattern recognition; random surface scattering model; roughness; two-level tree classifier; Image reconstruction; Inspection; Metals; Rough surfaces; Surface reconstruction; Surface roughness; Surface treatment;
  • fLanguage
    English
  • Journal_Title
    Systems, Man and Cybernetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9472
  • Type

    jour

  • DOI
    10.1109/TSMC.1984.6313276
  • Filename
    6313276