Title :
IDeF-X ECLAIRs: A CMOS ASIC for the Readout of CdTe and CdZnTe Detectors for High Resolution Spectroscopy
Author :
Gevin, Olivier ; Baron, Pascal ; Coppolani, Xavier ; Daly, François ; Delagnes, Eric ; Limousin, Olivier ; Lugiez, Francis ; Meuris, Aline ; Pinsard, Frédéric ; Renaud, Diana
Author_Institution :
CEA Saclay, Electron. de Detecteurs et dTnformatique, Gif-sur-Yvette, France
Abstract :
The very last member of the IDeF-X ASIC family is presented: IDeF-X ECLAIRs is a 32-channel front end ASIC designed for the readout of Cadmium Telluride (CdTe) and Cadmium Zinc Telluride (CdZnTe) Detectors. Thanks to its noise performance (Equivalent Noise Charge floor of 33 e- rms) and to its radiation hardened design (Single Event Latchup Linear Energy Transfer threshold of 56 MeV.cm2.mg-1), the chip is well suited for soft X-rays energy discrimination and high energy resolution, ldquospace proof,rdquo hard X-ray spectroscopy. We measured an energy low threshold of less than 4 keV with a 10 pF input capacitor and a minimal reachable sensitivity of the Equivalent Noise Charge (ENC) to input capacitance of less than 7 e-/pF obtained with a 6 mus peak time. IDeF-X ECLAIRs will be used for the readout of 6400 CdTe Schottky monopixel detectors of the 2D coded mask imaging telescope ECLAIRs aboard the SVOM satellite. IDeF-X ECLAIRs (or IDeF-X V2) has also been designed for the readout of a pixelated CdTe detector in the miniature spectro-imager prototype Caliste 256 that is currently foreseen for the high energy detector module of the Simbol-X mission.
Keywords :
CMOS integrated circuits; Schottky effect; X-ray spectra; integrated circuit design; integrated circuit noise; readout electronics; semiconductor counters; 2D coded mask imaging telescope ECLAIR; 32-channel front end ASIC; CMOS ASIC; CdTe detectors; CdZnTe detectors; IDeF-X ECLAIR; SVOM satellite; Schottky monopixel detectors; Simbol-X mission; equivalent noise charge; high energy detector module; high resolution spectroscopy; radiation hardened design; readout electronics; single event latchup linear energy transfer threshold; soft X-ray energy discrimination; space proof hard X-ray spectroscopy; spectro-imager prototype Caliste 256; Application specific integrated circuits; Cadmium compounds; Capacitance measurement; Detectors; Energy exchange; Energy resolution; Radiation hardening; Spectroscopy; X-rays; Zinc compounds; ASIC; CMOS; CdTe; CdZnTe; SVOM; Simbol-X; hard X-ray spectroscopy; latch up; noise;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2023989