• DocumentCode
    1300446
  • Title

    Design of self-checking sequential machines

  • Author

    Dhawan, Sudhir ; De Vries, Ronald C.

  • Author_Institution
    IBM, Austin, TX, USA
  • Volume
    37
  • Issue
    10
  • fYear
    1988
  • fDate
    10/1/1988 12:00:00 AM
  • Firstpage
    1280
  • Lastpage
    1284
  • Abstract
    The authors present the design of self-checking sequential machines using standard memory elements, i.e. D, T, or JK flip-flops. The design approach involves cascading the three parts of a sequential machine, i.e. excitation, memory elements, and the output circuit. Parity is used to detect and transmit errors from one part to the next. The conditions for testing D, T, and JK flip-flops and for transmitting errors from their inputs to their outputs are presented; these are shown to exist in normal operation when the design procedure is used. SR flip-flops are found not to have the properties necessary for designing self-checking sequential machines
  • Keywords
    flip-flops; sequential machines; design; error detection; error transmission; excitation; flip-flops; memory elements; self-checking sequential machines; Circuit faults; Circuit testing; Combinational circuits; DH-HEMTs; Feedback; Flip-flops; Sequential circuits; Shift registers; Strontium; Sufficient conditions;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.5989
  • Filename
    5989