DocumentCode
1300446
Title
Design of self-checking sequential machines
Author
Dhawan, Sudhir ; De Vries, Ronald C.
Author_Institution
IBM, Austin, TX, USA
Volume
37
Issue
10
fYear
1988
fDate
10/1/1988 12:00:00 AM
Firstpage
1280
Lastpage
1284
Abstract
The authors present the design of self-checking sequential machines using standard memory elements, i.e. D , T , or JK flip-flops. The design approach involves cascading the three parts of a sequential machine, i.e. excitation, memory elements, and the output circuit. Parity is used to detect and transmit errors from one part to the next. The conditions for testing D , T , and JK flip-flops and for transmitting errors from their inputs to their outputs are presented; these are shown to exist in normal operation when the design procedure is used. SR flip-flops are found not to have the properties necessary for designing self-checking sequential machines
Keywords
flip-flops; sequential machines; design; error detection; error transmission; excitation; flip-flops; memory elements; self-checking sequential machines; Circuit faults; Circuit testing; Combinational circuits; DH-HEMTs; Feedback; Flip-flops; Sequential circuits; Shift registers; Strontium; Sufficient conditions;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.5989
Filename
5989
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