DocumentCode :
1300446
Title :
Design of self-checking sequential machines
Author :
Dhawan, Sudhir ; De Vries, Ronald C.
Author_Institution :
IBM, Austin, TX, USA
Volume :
37
Issue :
10
fYear :
1988
fDate :
10/1/1988 12:00:00 AM
Firstpage :
1280
Lastpage :
1284
Abstract :
The authors present the design of self-checking sequential machines using standard memory elements, i.e. D, T, or JK flip-flops. The design approach involves cascading the three parts of a sequential machine, i.e. excitation, memory elements, and the output circuit. Parity is used to detect and transmit errors from one part to the next. The conditions for testing D, T, and JK flip-flops and for transmitting errors from their inputs to their outputs are presented; these are shown to exist in normal operation when the design procedure is used. SR flip-flops are found not to have the properties necessary for designing self-checking sequential machines
Keywords :
flip-flops; sequential machines; design; error detection; error transmission; excitation; flip-flops; memory elements; self-checking sequential machines; Circuit faults; Circuit testing; Combinational circuits; DH-HEMTs; Feedback; Flip-flops; Sequential circuits; Shift registers; Strontium; Sufficient conditions;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.5989
Filename :
5989
Link To Document :
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