• DocumentCode
    1300550
  • Title

    Thermooptical properties of transversely pumped composite YAG rods with a Nd-doped core

  • Author

    Lucianetti, A. ; Graf, Th. ; Weber, R. ; Weber, H.P.

  • Author_Institution
    Inst. of Appl. Phys., Bern Univ., Switzerland
  • Volume
    36
  • Issue
    2
  • fYear
    2000
  • Firstpage
    220
  • Lastpage
    227
  • Abstract
    We report on analytical, numerical, and experimental studies of the thermally induced optical distortions in transversally diode-pumped Nd:YAG composite laser rods. The calculated distributions of temperature, optical path difference, and stress are compared for two different laser rods, a homogeneously doped rod and a composite rod with a hexagonal Nd:YAG core in an undoped YAG rod. Our theoretical investigations of the optical path difference are experimentally confirmed by using a Mach-Zehnder interferometer. It is found that the optical path difference profile of the composite rod has stronger gradients than those of the homogeneously doped rod. In conjunction with experimental evidence, the paper illustrates that, for pump powers below 200 W the amount of birefringence is comparable for both laser rods.
  • Keywords
    Mach-Zehnder interferometers; birefringence; laser beams; laser variables measurement; light interferometry; neodymium; optical pumping; solid lasers; temperature distribution; thermal stresses; thermo-optical effects; 200 W; Mach-Zehnder interferometer; Nd-doped core; YAG:Nd; YAl5O12:Nd; birefringence; composite rod; hexagonal Nd:YAG core; homogeneously doped rod; laser rods; optical path difference distribution; optical path difference profile; pump powers; stress distribution; temperature distribution; thermally induced optical distortions; thermooptical properties; transversally diode-pumped Nd:YAG composite laser rods; transversely pumped composite YAG rods; undoped YAG rod; Diodes; Laser excitation; Laser noise; Laser theory; Optical distortion; Optical interferometry; Optical pumping; Pump lasers; Temperature distribution; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.823468
  • Filename
    823468