• DocumentCode
    1300591
  • Title

    Software reliability models with time-dependent hazard function based on Bayesian approach

  • Author

    Pham, Loan ; Pham, Hoang

  • Author_Institution
    Dept. of Ind. Eng., Rutgers Univ., Piscataway, NJ, USA
  • Volume
    30
  • Issue
    1
  • fYear
    2000
  • fDate
    1/1/2000 12:00:00 AM
  • Firstpage
    25
  • Lastpage
    35
  • Abstract
    In this paper, two models predicting mean time until next failure based on Bayesian approach are presented. Times between failures follow Weibull distributions with stochastically decreasing ordering on the hazard functions of successive failure time intervals, reflecting the tester´s intent to improve the software quality with each corrective action. We apply the proposed models to actual software failure data and show they give better results under sum of square errors criteria as compared to previous Bayesian models and other existing times between failures models. Finally, we utilize likelihood ratios criterion to compare new model´s predictive performance
  • Keywords
    Bayes methods; Weibull distribution; failure analysis; probability; program debugging; software reliability; Bayes method; Weibull distribution; debugging; failure time intervals; likelihood ratios; probability density function; software reliability; time-dependent hazard function; times between failures; Bayesian methods; Computer errors; Debugging; Hazards; Maximum likelihood estimation; Military computing; Predictive models; Software quality; Software reliability; Telecommunication computing;
  • fLanguage
    English
  • Journal_Title
    Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4427
  • Type

    jour

  • DOI
    10.1109/3468.823478
  • Filename
    823478