DocumentCode :
1300591
Title :
Software reliability models with time-dependent hazard function based on Bayesian approach
Author :
Pham, Loan ; Pham, Hoang
Author_Institution :
Dept. of Ind. Eng., Rutgers Univ., Piscataway, NJ, USA
Volume :
30
Issue :
1
fYear :
2000
fDate :
1/1/2000 12:00:00 AM
Firstpage :
25
Lastpage :
35
Abstract :
In this paper, two models predicting mean time until next failure based on Bayesian approach are presented. Times between failures follow Weibull distributions with stochastically decreasing ordering on the hazard functions of successive failure time intervals, reflecting the tester´s intent to improve the software quality with each corrective action. We apply the proposed models to actual software failure data and show they give better results under sum of square errors criteria as compared to previous Bayesian models and other existing times between failures models. Finally, we utilize likelihood ratios criterion to compare new model´s predictive performance
Keywords :
Bayes methods; Weibull distribution; failure analysis; probability; program debugging; software reliability; Bayes method; Weibull distribution; debugging; failure time intervals; likelihood ratios; probability density function; software reliability; time-dependent hazard function; times between failures; Bayesian methods; Computer errors; Debugging; Hazards; Maximum likelihood estimation; Military computing; Predictive models; Software quality; Software reliability; Telecommunication computing;
fLanguage :
English
Journal_Title :
Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
Publisher :
ieee
ISSN :
1083-4427
Type :
jour
DOI :
10.1109/3468.823478
Filename :
823478
Link To Document :
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