Title :
An iterative measured equation technique for electromagnetic problems
Author :
Chen, Jun ; Hong, Wei ; Jin, Jian-Ming
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fDate :
1/1/1998 12:00:00 AM
Abstract :
An iterative measured equation technique (IMET) is presented for a numerical solution of electromagnetic problems. This technique is an extension and improvement of the method of measured equation of invariance (MEI). In this technique, an iterative scheme is designed in such away that a new set of metrons used to generate the measured equations is formed in each iteration based on the solution of the previous iteration. The new metrons are more meaningful in that they converge to the physical quantity of interest such as the surface current density for electrodynamic problems and the surface charge density for electrostatic problems. The IMET offers several advantages over the MEI method because it requires only two mesh layers, resulting in a significant reduction in the memory requirement and computing time. More importantly, it provides a means for a systematic improvement of the accuracy of solution. The IMET is applied successfully to two-dimensional (2-D) electrodynamic and three-dimensional (3-D) electrostatic problems. Numerical results show that the technique is highly accurate and the iterative process converges very quickly, usually within two iterations
Keywords :
convergence of numerical methods; electromagnetism; iterative methods; IMET; MEI; convergence; electromagnetism; iterative measured equation technique; measured equation of invariance; mesh layer; metron; numerical method; surface charge density; surface current density; three-dimensional electrostatics; two-dimensional electrodynamics; Boundary conditions; Current density; Electrodynamics; Electromagnetic measurements; Electromagnetic scattering; Electrostatic measurements; Equations; Iterative algorithms; Transmission line matrix methods; Two dimensional displays;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on