• DocumentCode
    1300688
  • Title

    Split frequencies in planar axisymmetric gyroelectric resonators

  • Author

    Sheikh, Sharif Iqbal ; Gibson, Andrew A P ; Dillon, Bernice M.

  • Author_Institution
    Islamic Inst. of Technol., Dakka, Bangladesh
  • Volume
    46
  • Issue
    1
  • fYear
    1998
  • fDate
    1/1/1998 12:00:00 AM
  • Firstpage
    62
  • Lastpage
    69
  • Abstract
    Axisymmetric gyroelectric disk, ring, and composite resonator structures have been characterized for both InSb and GaAs semiconductors at 77 K. The calculations assume that these materials can be represented by the tensor permittivity derived from the Drude model of cyclotron motion in a plasma. Resonance and loss regions are identified and the sensitivity of normal mode splitting and onset frequencies to material and geometrical variables are graphed and tabulated. The information is presented in terms of signal frequency and the bias field to permit a direct comparison with results from ferrimagnetic structures. Semiconductor calculations show two extraordinary wave resonances and predict excellent symmetrical wide-band normal mode splitting. Field plots for the semiconductor disk and ring are included to explain coupled mode behaviour between modes in different bias regions
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; microwave devices; millimetre wave devices; permittivity; resonators; semiconductor devices; 77 K; Drude model; GaAs; GaAs resonator; InSb; InSb resonator; bias field; composite resonator structures; coupled mode behaviour; cyclotron motion; geometrical variables; gyroelectric disk resonator; gyroelectric ring resonator; loss regions; material variables; normal mode splitting; onset frequencies; planar axisymmetric gyroelectric resonators; plasma; resonance regions; semiconductors; sensitivity; split frequencies; tensor permittivity; wave resonances; Composite materials; Cyclotrons; Ferrimagnetic materials; Frequency; Gallium arsenide; Permittivity; Plasma materials processing; Resonance; Semiconductor materials; Tensile stress;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.654923
  • Filename
    654923