An automated system for measuring power devices in Ka-band

Author

Bonte, Bertrand ; Gaquiere, Christophe ; Bourcier, Eric ; Lemeur, G. ; Crosnier, Yves

Author_Institution

Dept. Hyperfrequences et Semicond., Inst. d´´Electr. et de Microelectron. du Nord, Villeneuve d´´Ascq, France

Volume

46

Issue

1

fYear

1998

fDate

1/1/1998 12:00:00 AM

Firstpage

70

Lastpage

75

Abstract

An active load-pull system is presented for measuring devices from 50-μm to 3-mm gatewidth in Ka-band. It can automatically scan the interesting area of the Smith chart. The system protects the tested devices because the impedance is presented at the output of the device only if the gate current is lower than a fixed value. Results are presented at 30 and 38 GHz on a pseudomorphic high electron-mobility transistor (PM-HEMT)

Keywords

S-parameters; automatic test equipment; automatic testing; calibration; microwave measurement; microwave power transistors; millimetre wave measurement; millimetre wave power transistors; power semiconductor devices; semiconductor device testing; 26 to 40 GHz; 30 GHz; 38 GHz; 50 micron to 3 mm; ATE; EHF; Ka-band; MM-wave devices; PHEMT; SHF; Smith chart; active load-pull system; automated system; high electron-mobility transistor; microwave devices; power device measurement; pseudomorphic HEMT; Design automation; Frequency; Impedance measurement; Integrated circuit measurements; Integrated circuit modeling; Microwave devices; Microwave transistors; Power measurement; Pulse measurements; Tuners;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.654924

Filename

654924