Title :
The Light Field Camera: Extended Depth of Field, Aliasing, and Superresolution
Author :
Bishop, Tom E. ; Favaro, Paolo
Author_Institution :
Anthropics Technol. Ltd., London, UK
fDate :
5/1/2012 12:00:00 AM
Abstract :
Portable light field (LF) cameras have demonstrated capabilities beyond conventional cameras. In a single snapshot, they enable digital image refocusing and 3D reconstruction. We show that they obtain a larger depth of field but maintain the ability to reconstruct detail at high resolution. In fact, all depths are approximately focused, except for a thin slab where blur size is bounded, i.e., their depth of field is essentially inverted compared to regular cameras. Crucial to their success is the way they sample the LF, trading off spatial versus angular resolution, and how aliasing affects the LF. We show that applying traditional multiview stereo methods to the extracted low-resolution views can result in reconstruction errors due to aliasing. We address these challenges using an explicit image formation model, and incorporate Lambertian and texture preserving priors to reconstruct both scene depth and its superresolved texture in a variational Bayesian framework, eliminating aliasing by fusing multiview information. We demonstrate the method on synthetic and real images captured with our LF camera, and show that it can outperform other computational camera systems.
Keywords :
Bayes methods; image reconstruction; image resolution; image texture; stereo image processing; 3D reconstruction; LF camera; Lambertian object; aliasing; angular resolution; blur size; depth of field; digital image refocusing; explicit image formation model; multiview stereo method; portable light field camera; spatial resolution; superresolution; texture preserving priors; variational Bayesian framework; Apertures; Cameras; Estimation; Lenses; Microoptics; Spatial resolution; Computational photography; blind deconvolution; deconvolution; multiview stereo; shape from defocus.; superresolution;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2011.168