Title :
Zn indiffusion waveguide polarizer on a Y-cut LiNbO3 at 1.32-μm wavelength
Author :
Ruey-Ching Twu ; Chia-Chih Huang ; Way-Seen Wang
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
A polarization-dependent loss measurement of Zn indiffusion (ZI) waveguide on a Y-cut LiNbO3 substrate is firstly reported. The measured results show that the waveguides support either a single extraordinary polarization or both extraordinary and ordinary polarizations depending on the fabrication process parameters. For the single extraordinary polarization waveguide, the measured propagation loss at 1.32-μm wavelength is 0.9 dB/cm and the best measured polarization extinction ratio is 44 dB at a distance of 1.5 cm from the input end, which are quite good for being a waveguide polarizer. Moreover, the voltage-length product measured for the ZI Mach-Zehnder modulator shows that the substrate electrooptic coefficient is not degraded.
Keywords :
electro-optical modulation; light polarisation; lithium compounds; optical fabrication; optical loss measurement; optical losses; optical materials; optical planar waveguides; optical polarisers; optical waveguide components; zinc; 1.32 mum; LiNbO/sub 3/; LiNbO/sub 3/:Zn; Mach-Zehnder modulator; Y-cut material; Zn indiffusion waveguide; Zn indiffusion waveguide polarizer; extraordinary polarizations; fabrication process parameters; input end; ordinary polarizations; polarization extinction ratio; polarization-dependent loss measurement; propagation loss; single extraordinary polarization; single extraordinary polarization waveguide; substrate electrooptic coefficient; voltage-length product; waveguide polarizer; Extinction ratio; Loss measurement; Optical device fabrication; Optical polarization; Optical surface waves; Optical waveguides; Propagation losses; Surface acoustic wave devices; Wavelength measurement; Zinc;
Journal_Title :
Photonics Technology Letters, IEEE
