DocumentCode
1300781
Title
Mining Crosscutting Concerns through Random Walks
Author
Zhang, Charles ; Jacobsen, Hans-Arno
Author_Institution
Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
Volume
38
Issue
5
fYear
2012
Firstpage
1123
Lastpage
1137
Abstract
Inspired by our past manual aspect mining experiences, this paper describes a probabilistic random walk model to approximate the process of discovering crosscutting concerns (CCs) in the absence of the domain knowledge about the investigated application. The random walks are performed on the concept graphs extracted from the program sources to calculate metrics of “utilization” and “aggregation” for each of the program elements. We rank all the program elements based on these metrics and use a threshold to produce a set of candidates that represent crosscutting concerns. We implemented the algorithm as the Prism CC miner (PCM) and evaluated PCM on Java applications ranging from a small-scale drawing application to a medium-sized middleware application and to a large-scale enterprise application server. Our quantification shows that PCM is able to produce comparable results (95 percent accuracy for the top 125 candidates) with respect to the manual mining effort. PCM is also significantly more effective as compared to the conventional approach.
Keywords
Java; aspect-oriented programming; data mining; graph theory; middleware; probability; small-to-medium enterprises; Java applications; Prism CC miner; aggregation metric; aspect mining; concept graphs; crosscutting concerns mining; large-scale enterprise application server; medium-sized middleware application; probabilistic random walk model; program elements; program sources; small-scale drawing application; utilization metric; Algorithm design and analysis; Computational modeling; Data mining; Manuals; Mathematical model; Phase change materials; Radiation detectors; Aspect mining; mining crosscutting concerns;
fLanguage
English
Journal_Title
Software Engineering, IEEE Transactions on
Publisher
ieee
ISSN
0098-5589
Type
jour
DOI
10.1109/TSE.2011.83
Filename
5989837
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