A 10-Gb/s silicon bipolar IC for PRBS testing

Author

Kromat, Oliver ; Langmann, Ulrich ; Hanke, Gerhard ; Hillery, William J.

Author_Institution

Lehrstuhl fur Elektronische Bauelemente, Ruhr-Univ., Bochum, Germany

Volume

33

Issue

1

fYear

1998

fDate

1/1/1998 12:00:00 AM

Firstpage

76

Lastpage

85

Abstract

A 10 Gb/s silicon bipolar IC for pseudorandom binary sequence (PRBS) testing was fabricated and tested. The IC features PRBS generation of the sequences of length 2¹⁵-1 and 2²³-1 b up to 10 Gb/s according to CCITT recommendations. Furthermore, the IC is capable of analyzing PRB sequences of the same length and generation polynomials so that a full test of components is possible. In addition, a new PRBS test word synchronization can be provided between two chips for external multiplexing of the sequences up to 40 Gb/s. The IC can be connected to a standard PC, so evaluation of the error test data can be performed in a flexible way. The IC was fabricated with the HP25 process of Hewlett Packard company, the chip size is 32 mm², and it consumes 6.2 W at the nominal supply voltage of -5 V

Keywords

binary sequences; bipolar digital integrated circuits; elemental semiconductors; multiplexing; silicon; synchronisation; -5 V; 10 to 40 Gbit/s; 6.2 W; CCITT recommendations; Hewlett Packard HP25 process; PRBS testing; STM; Si; bipolar IC; error test data; external multiplexing; generation polynomials; pseudorandom binary sequence; synchronous transport model; test word synchronization; Binary sequences; Bipolar integrated circuits; Circuit testing; Displays; Integrated circuit testing; Logic; Performance evaluation; Polynomials; Signal generators; Silicon;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.654939

Filename

654939