Title :
Amplitude Frequency Response Measurement: A Simple Technique
Author :
Satish, L. ; Vora, Santosh C.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Sci., Bangalore, India
Abstract :
A simple method is described to combine a modern function generator and a digital oscilloscope to configure a setup that can directly measure the amplitude frequency response of a system. This is achieved by synchronously triggering both instruments, with the function generator operated in the “Linear-Sweep” frequency mode, while the oscilloscope is operated in the “Envelope” acquisition mode. Under these conditions, the acquired envelopes directly correspond to the (input and output signal) spectra, whose ratio yields the amplitude frequency response. The method is easy to configure, automatic, time-efficient, and does not require any external control or interface or programming. This method is ideally suited to impart hands-on experience in sweep frequency response measurements, demonstrate resonance phenomenon in transformer windings, explain the working principle of an impedance analyzer, practically exhibit properties of network functions, and so on. The proposed method is an inexpensive alternative to existing commercial equipment meant for this job and is also an effective teaching aid. Details of its implementation, along with some practical measurements on an actual transformer, are presented.
Keywords :
digital storage oscilloscopes; frequency measurement; function generators; actual transformer; amplitude frequency response measurement; commercial equipment; digital oscilloscope; envelope acquisition mode; function generator; impedance analyzer; instruments triggering; linear-sweep frequency mode; transformer windings; Automatic control; Automatic programming; Frequency measurement; Frequency response; Impedance measurement; Instruments; Oscilloscopes; Resonance; Signal generators; Windings; Frequency response amplitude and phase; impedance analyzer; normal and envelope acquisition mode; sweep frequency measurement; transformer diagnostics;
Journal_Title :
Education, IEEE Transactions on
DOI :
10.1109/TE.2009.2023082