Title :
Modular Datapath Optimization and Verification Based on Modular-HED
Author :
Alizadeh, Bijan ; Fujita, Masahiro
Author_Institution :
VLSI Design & Educ. Center, Univ. of Tokyo, Tokyo, Japan
Abstract :
This paper proposes an automatic design flow of datapath-dominated applications which is able to deal with optimization and equivalence checking of multi-output polynomials over Z2n. This paper also gives four main contributions: 1) proposing a complete design flow for modular equivalence checking, high level synthesis, and optimization; 2) considering hidden monomials to factorize those polynomials which do not have any common monomials; 3) combining and improving our previous optimization heuristics to eliminate multi-operand common sub-expressions as much as possible; and 4) implementing all algorithms on top of the modular Horner expansion diagram package. Experimental results have shown an average saving of 9.9% and 4.5% in the number of gates and critical path delay, respectively, after applying modular reduction over Z2n, while other optimization techniques are not used. Besides, after applying our optimization techniques, experimental comparisons with the state-of-the-art techniques show an average improvement in the area by 19.5% with an average delay decrease of 16.7%. Regarding the comparison with our previous papers, the area and delay are improved by 13.3% and 15.5%, respectively.
Keywords :
embedded systems; formal verification; high level synthesis; optimisation; polynomials; signal processing; Horner expansion diagram; datapath-dominated applications; equivalence checking; hidden monomials; high level synthesis; modular datapath optimization; modular datapath verification; modular-HED; multioutput polynomials; Algorithm design and analysis; Complexity theory; Delay; Digital signal processing; Logic gates; Optimization; Polynomials; Equivalence checking; horner expansion diagram (HED); modular optimization; multi-output polynomial datapath optimization;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2010.2059271