DocumentCode :
1301046
Title :
Analysis of leakage current induced nonlinearity in resistor-ladder based data converters
Author :
Maulik, Prabir C.
Author_Institution :
Crystal Semicond. Products Div., Cirrus Logic Inc., Austin, TX, USA
Volume :
47
Issue :
2
fYear :
2000
fDate :
2/1/2000 12:00:00 AM
Firstpage :
136
Lastpage :
137
Abstract :
This work analyzes nonlinearities caused by leakage currents in resistor-ladder based data converters. Expressions are derived for integral and differential nonlinearity
Keywords :
analogue-digital conversion; digital-analogue conversion; ladder networks; leakage currents; network analysis; ADC; DAC; differential nonlinearity; integral and differential nonlinearity; leakage current induced nonlinearity; resistor-ladder based data converters; Analog-digital conversion; Circuits; Decoding; Diodes; Leakage current; Logic devices; Nonlinear equations; Resistors; Switches; Voltage;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7130
Type :
jour
DOI :
10.1109/82.823542
Filename :
823542
Link To Document :
بازگشت