DocumentCode :
1301588
Title :
Thermal Modeling and Analysis for 3-D ICs With Integrated Microchannel Cooling
Author :
Mizunuma, H. ; Yi-Chang Lu ; Chia-Lin Yang
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
30
Issue :
9
fYear :
2011
Firstpage :
1293
Lastpage :
1306
Abstract :
Integrated microchannel liquid-cooling technology is envisioned as a viable solution to alleviate an increasing thermal stress imposed by 3-D stacked ICs. Thermal modeling for microchannel cooling is challenging due to its complicated thermal-wake effect, a localized temperature wake phenomenon downstream of a heated source in the flow. This paper presents a fast and accurate thermal-wake aware thermal model for integrated microchannel 3-D ICs. A combination of the microchannel thermal-wake function and the channel merging technique achieves more than 3300× speedup with less than 5% error in comparison with a commercial numerical finite volume simulation tool. With the proposed model, we characterize thermal behaviors of microchannel-cooled 3-D ICs and compare them with the case of conventional air-cooled 3-D ICs. We also demonstrate thermal-aware placements using our thermal model. It shows that the proposed model can be used to reduce peak temperatures, which is considered important for 3-D IC designs.
Keywords :
cooling; finite volume methods; heat sinks; integrated circuit modelling; microchannel flow; thermal stresses; three-dimensional integrated circuits; wakes; 3D IC design; 3D stacked IC; integrated microchannel 3D IC; integrated microchannel liquid-cooling technology; localized temperature wake phenomenon; microchannel thermal wake function; numerical finite volume simulation tool; thermal aware placement; thermal modeling; thermal stress; thermal wake effect; Heating; Integrated circuit modeling; Microchannel; Numerical models; Solid modeling; Solids; 3-D ICs; microchannel; placement; thermal-wakes;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2011.2144596
Filename :
5989994
Link To Document :
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