• DocumentCode
    1301666
  • Title

    Charge-control analysis of collector transit time for (AlGa)As/GaAs HBTs under a high injection condition

  • Author

    Katoh, Riichi

  • Author_Institution
    Toshiba Corp., Kawasaki, Japan
  • Volume
    37
  • Issue
    10
  • fYear
    1990
  • fDate
    10/1/1990 12:00:00 AM
  • Firstpage
    2176
  • Lastpage
    2182
  • Abstract
    Charge-control analysis of collector transit time (τC ) for (AlGa)As/GaAs n-p+-n heterojunction bipolar transistors has been carried out under the restriction of low-frequency approximation to explain the remarkable τC reduction at the onset of the Kirk effect. The fundamental idea of the model is that the increment of the current density must depend not only on the increment of the carrier density but also on the increment of the carrier drift velocity in the collector space-charge region. The obtained model well explains the previous Monte Carlo results, thus indicating the validity of the above idea as well as the possibility that the actual τC is by far smaller than that estimated from the conventional model. It also leads to a concept for the reduction of transit times, i.e. that an increasing rate of the electron overshoot velocity is as essential for the reduction of τC as the magnitude of the overshoot velocity itself
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; AlGaAs-GaAs; Kirk effect; Monte Carlo results; carrier density; carrier drift velocity; collector space-charge region; collector transit time; current density; electron overshoot velocity; heterojunction bipolar transistors; high injection condition; low-frequency approximation; model; modeling; n-p+-n transistors; reduction of transit times; Analytical models; Charge carrier density; Current density; Electron mobility; Gallium arsenide; Heterojunction bipolar transistors; Kirk field collapse effect; Monte Carlo methods; Research and development; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.59907
  • Filename
    59907