DocumentCode :
1301666
Title :
Charge-control analysis of collector transit time for (AlGa)As/GaAs HBTs under a high injection condition
Author :
Katoh, Riichi
Author_Institution :
Toshiba Corp., Kawasaki, Japan
Volume :
37
Issue :
10
fYear :
1990
fDate :
10/1/1990 12:00:00 AM
Firstpage :
2176
Lastpage :
2182
Abstract :
Charge-control analysis of collector transit time (τC ) for (AlGa)As/GaAs n-p+-n heterojunction bipolar transistors has been carried out under the restriction of low-frequency approximation to explain the remarkable τC reduction at the onset of the Kirk effect. The fundamental idea of the model is that the increment of the current density must depend not only on the increment of the carrier density but also on the increment of the carrier drift velocity in the collector space-charge region. The obtained model well explains the previous Monte Carlo results, thus indicating the validity of the above idea as well as the possibility that the actual τC is by far smaller than that estimated from the conventional model. It also leads to a concept for the reduction of transit times, i.e. that an increasing rate of the electron overshoot velocity is as essential for the reduction of τC as the magnitude of the overshoot velocity itself
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; AlGaAs-GaAs; Kirk effect; Monte Carlo results; carrier density; carrier drift velocity; collector space-charge region; collector transit time; current density; electron overshoot velocity; heterojunction bipolar transistors; high injection condition; low-frequency approximation; model; modeling; n-p+-n transistors; reduction of transit times; Analytical models; Charge carrier density; Current density; Electron mobility; Gallium arsenide; Heterojunction bipolar transistors; Kirk field collapse effect; Monte Carlo methods; Research and development; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.59907
Filename :
59907
Link To Document :
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