• DocumentCode
    1301687
  • Title

    Integrating online and offline testing of a switching memory

  • Author

    Barbagallo, Stefano ; Medina, Davide ; Corno, Fulvio ; Prinetto, Paolo ; Reorda, Matteo Sonza

  • Author_Institution
    Italtel Soc. Italiana Telecommun. SpA, Milan, Italy
  • Volume
    15
  • Issue
    1
  • fYear
    1998
  • Firstpage
    63
  • Lastpage
    70
  • Abstract
    A circuit used in a telephone switching unit features several test techniques, including BIST, partial scan, and boundary scan. By sharing the same circuitry for both online and offline testing, the design minimizes additional logic while achieving very high fault coverage
  • Keywords
    built-in self test; integrated circuit testing; integrated memory circuits; logic testing; switching circuits; BIST; boundary scan; fault coverage; offline testing; online testing; partial scan; switching memory; telephone switching unit; testing; Bit rate; Circuit faults; Circuit testing; Integrated circuit interconnections; Logic testing; Microprocessors; Narrowband; Sliding mode control; Speech; Switching circuits;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.655184
  • Filename
    655184
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1301687