Title :
Integrating online and offline testing of a switching memory
Author :
Barbagallo, Stefano ; Medina, Davide ; Corno, Fulvio ; Prinetto, Paolo ; Reorda, Matteo Sonza
Author_Institution :
Italtel Soc. Italiana Telecommun. SpA, Milan, Italy
Abstract :
A circuit used in a telephone switching unit features several test techniques, including BIST, partial scan, and boundary scan. By sharing the same circuitry for both online and offline testing, the design minimizes additional logic while achieving very high fault coverage
Keywords :
built-in self test; integrated circuit testing; integrated memory circuits; logic testing; switching circuits; BIST; boundary scan; fault coverage; offline testing; online testing; partial scan; switching memory; telephone switching unit; testing; Bit rate; Circuit faults; Circuit testing; Integrated circuit interconnections; Logic testing; Microprocessors; Narrowband; Sliding mode control; Speech; Switching circuits;
Journal_Title :
Design & Test of Computers, IEEE
