Title :
Analog BIST Functionality for Microhotplate Temperature Sensors
Author :
Afridi, Muhammad ; Montgomery, Christopher B. ; Cooper-Balis, Elliott ; Semancik, Stephen ; Kreider, Kenneth G. ; Geist, Jon
Author_Institution :
Semicond. Electron. Div., NIST, Gaithersburg, MD, USA
Abstract :
In this letter, we describe a novel long-term microhotplate temperature-sensor calibration technique suitable for built-in self-test (BIST). The microhotplate thermal resistance (thermal efficiency) and the thermal voltage from an integrated platinum/rhodium thermocouple were calibrated against a polysilicon temperature-sensor calibration curve which drifts over time. Both of these temperature sensors, which cannot be directly calibrated, exhibit excellent long-term temperature stability and are appropriate for BIST functionality.
Keywords :
built-in self test; calibration; temperature sensors; thermal resistance; thermal stability; thermocouples; analog BIST functionality; built-in self-test; calibration technique; integrated platinum-rhodium thermocouple; long-term temperature stability; microhotplate temperature sensors; microhotplate thermal resistance; polysilicon temperature-sensor calibration; thermal efficiency; thermal voltage; Built-in self-test (BIST); calibration; microhotplate; platinum/rhodium; sensor; temperature; thermocouple;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2009.2027038