Title :
Enhancement-Mode AlN/GaN/AlGaN DHFET With 700-mS/mm
and 112-GHz
Author :
Corrion, A.L. ; Shinohara, K. ; Regan, D. ; Milosavljevic, I. ; Hashimoto, P. ; Willadsen, P.J. ; Schmitz, A. ; Wheeler, D.C. ; Butler, C.M. ; Brown, D. ; Burnham, S.D. ; Micovic, M.
Author_Institution :
HRL Labs., LLC, Malibu, CA, USA
Abstract :
An enhancement-mode (E-mode) AlN/GaN/AlGaN double-heterojunction field-effect transistor (DHFET) with record high-frequency performance is reported. E-mode operation was achieved through vertical scaling of the AlN barrier layer. Parasitic resistances were reduced through ohmic contact recess etching followed by regrowth of n+ GaN by molecular-beam epitaxy and SiN deposition to increase the sheet charge density in the access regions of the device, resulting in an extremely low on-resistance of 1.06 Ω · mm. A DHFET with an 80-nm gate length had a threshold voltage of 0.21 V, an extrinsic transconductance (gm) of 0.70 S/mm, a current-gain cutoff frequency (fT) of 112 GHz, and a maximum oscillation frequency (fmax) of 215 GHz. To our knowledge, these are the highest gm , fT, and fmax values reported to date for an E-mode GaN HFET.
Keywords :
aluminium compounds; etching; field effect transistors; gallium compounds; molecular beam epitaxial growth; wide band gap semiconductors; AlN-GaN-AlGaN; deposition; double heterojunction field effect transistor; e-mode operation; enhancement mode; extrinsic transconductance; frequency 112 GHz; frequency 215 GHz; maximum oscillation frequency; molecular beam epitaxy; ohmic contact recess etching; parasitic resistance; voltage 0.21 V; Aluminum gallium nitride; Gallium nitride; HEMTs; Logic gates; MODFETs; Resistance; Silicon compounds; Current-gain cutoff frequency $(f_{T})$; GaN; enhancement mode (E-mode); heterojunction field-effect transistor (HFET); high electron mobility transistor (HEMT);
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2010.2058845