DocumentCode :
1302514
Title :
Automatic Smith-diagram display
Volume :
3
Issue :
33
fYear :
1957
fDate :
9/1/1957 12:00:00 AM
Firstpage :
514
Keywords :
admittance measurement; semiconductor diodes;
fLanguage :
English
Journal_Title :
Electrical Engineers, Journal of the Institution of
Publisher :
iet
Type :
jour
DOI :
10.1049/jiee-3.1957.0247
Filename :
5322983
Link To Document :
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