Title :
Performance of the Low-Jitter High-Gain/Bandwidth Front-End Electronics of the HADES tRPC Wall
Author :
Belver, Daniel ; Cabanelas, P. ; Castro, E. ; Garzón, J.A. ; Gil, A. ; Gonzalez-Diaz, D. ; Koenig, W. ; Traxler, M.
Author_Institution :
LabCAF, Univ. de Santiago de Compostela, Santiago de Compostela, Spain
Abstract :
A front-end electronics (FEE) chain for accurate time measurements has been developed for the new Resistive Plate Chamber (RPC)-based Time-of-Flight (TOF) wall of the High Acceptance Di-Electron Spectrometer (HADES). The wall covers an area of around 8 m2, divided in 6 sectors. In total, 1122 4-gap timing RPC cells are read-out by 2244 time and charge sensitive channels. The FEE chain consists of 2 custom-made boards: a 4-channel DaughterBOard (DBO) and a 32-channel MotherBOard (MBO). The DBO uses a fast 2 GHz amplifier feeding a dual high-speed discriminator. The time and charge information are encoded, respectively, in the leading edge and the width of an LVDS signal. Each MBO houses up to 8 DBOs providing them regulated voltage supply, threshold values via DACs, test signals and, additionally, routing out a signal proportional to the channel multiplicity needed for a 1st level trigger decision. The MBO delivers LVDS signals to a multi-purpose Trigger Readout Board (TRB) for data acquisition. The FEE allows achieving a system resolution around 75 ps fulfilling comfortably the requirements of the HADES upgrade .
Keywords :
data acquisition; nuclear electronics; position sensitive particle detectors; readout electronics; 32-channel motherboard; 4-channel daughterboard; DBO; FEE chain; HADES; High Acceptance Di-Electron Spectrometer; LVDS signal; MBO; TOF; TRB; charge sensitive channels; data acquisition; dual high-speed discriminator; frequency 2 GHz; low-jitter high-gain front-end electronics; multipurpose trigger readout board; resistive plate chamber; time-of-flight; timing RPC; Bandwidth; Data acquisition; Detectors; Jitter; Noise; Signal resolution; Timing; Charge to width algorithm; HADES; fast amplifying and digitizing electronics; front-end electronics; time of flight; timing RPC;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2056928