Title :
Analysis of tape surface roughness by magnetic recording and mechanical methods
Author :
Luo, Peng ; Tan, Sanwu ; Bertram, H. Neal ; Hughes, Gordon ; Talke, Frank E.
Author_Institution :
Center for Magnetic Recording Res., California Univ., San Diego, La Jolla, CA, USA
Abstract :
Tape surface roughness noise is a large component of medium noise in high-density tape recording systems. Here, the results of tape surface roughness characterization by both mechanical and magnetic measurements are presented. The goal is to measure and compare both RMS roughness variance σ and roughness correlation length l. The results show that the magnetic recording determination of σ and l agrees extremely well with the mechanical measurements.
Keywords :
magnetic recording noise; magnetic tapes; surface topography; correlation length; high density magnetic recording; magnetic measurement; mechanical measurement; tape surface roughness noise; variance; Magnetic analysis; Magnetic heads; Magnetic noise; Magnetic recording; Magnetic variables measurement; Mechanical variables measurement; Optical surface waves; Rough surfaces; Scanning electron microscopy; Surface roughness;
Journal_Title :
Magnetics, IEEE Transactions on
