DocumentCode :
1303123
Title :
An Investigation of a Novel Snapback-Free Reverse-Conducting IGBT and With Dual Gates
Author :
Zhu, Liheng ; Chen, Xingbi
Author_Institution :
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Volume :
59
Issue :
11
fYear :
2012
Firstpage :
3048
Lastpage :
3053
Abstract :
A novel reverse-conducting insulated-gate bipolar transistor (RC-IGBT) with an automatically controlled anode gate, named AG-RC-IGBT, is proposed in this paper, wherein a gate on the reverse IGBT is intrinsically off in the forward conduction state and can be automatically turned on in the reverse conduction state. Therefore, bidirectional conduction capability with snapback-free characteristics is achieved in the novel RC-IGBT. Depending on the parameters set on the reverse IGBT, its operation mode can be either like an antiparallel IGBT or like an antiparallel MOS-controlled thyristor (MCT). The antiparallel MCT mode can yield low snapback current densities and low on-state voltages in both forward and reverse conductions. Two-dimensional numerical simulations show that snapback-free characteristics are obtained in the AG-RC-IGBT antiparallel with an IGBT by a 15-μm-wide half-pitch in both forward and reverse conduction states. The antiparallel MCT mode achieves low on-state voltages of 0.97 and 1.6 V at the current density of 200 A/cm2 in reverse and forward conduction states, respectively.
Keywords :
current density; insulated gate bipolar transistors; numerical analysis; thyristors; AG-RC-IGBT antiparallel; antiparallel IGBT; antiparallel MCT mode; antiparallel MOS-controlled thyristor; automatically controlled anode gate; bidirectional conduction capability; dual gates; forward conduction state; low on-state voltages; reverse conduction state; reverse-conducting insulated-gate bipolar transistor; size 15 mum; snapback current density; snapback-free reverse-conducting IGBT; two-dimensional numerical simulations; voltage 0.97 V; voltage 1.6 V; Bipolar transistors; Current density; Doping; Insulated gate bipolar transistors; Logic gates; Thyristors; Insulated-gate bipolar transistor (IGBT); reverse conducting; snapback; turn off;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2215039
Filename :
6316140
Link To Document :
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