Title :
Fluid/Structure Interaction Investigation in PBGA Packaging
Author :
Ramdan, Dadan ; Abdullah, Mohd Zulkifly ; Khor, ChuYee ; Leong, Wei Chiat ; Loh, Wei Keat ; Ooi, Chun Keang ; Ooi, Renn Chan
Author_Institution :
Sch. of Mech. Eng., Univ. Sains Malaysia, Nibong Tebal, Malaysia
Abstract :
This paper presents experimental and simulation studies of 3-D fluid/structure interaction (FSI) of wire sweep during the encapsulation process of plastic ball grid array (PBGA) packaging in different dies (single and stacked dies). A scaled-up package is fabricated to emulate the encapsulation of PBGA packaging and to study the effects of the FSI phenomenon in the PBGA package. A 3-D model of the mold and wires is created using GAMBIT, and the FSI is simulated using FLUENT and ABAQUS software integrated with mesh-based parallel code coupling interface for the real-time calculations. The effects of the stacked die and inlet pressure of the mold cavity on the melt flow behavior and wire sweep are mainly studied. A constant viscosity of the test fluid is assumed for the experiment. The volume-of-fluid technique is applied for melt-front tracking in the analysis. The numerical results of melt-front patterns and wire sweep are compared with the experimental results and good conformity is found. It is observed that the stacked die significantly influences the melt-front profile and the eventual wire sweep; as the number of dies in the stack increases, the wire sweep also increases.
Keywords :
ball grid arrays; encapsulation; plastic packaging; ABAQUS; FLUENT; FSI; GAMBIT; PBGA packaging; encapsulation process; fluid/structure interaction investigation; melt-front patterns; melt-front tracking; mesh-based parallel code coupling interface; plastic ball grid array; test fluid; volume-of-fluid technique; wire sweep; Analytical models; Couplings; Encapsulation; Equations; Solid modeling; Wires; Fluid structure interaction; mesh-based parallel code coupling interface; volume of fluid; wire sweep;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2012.2215860