DocumentCode
1304107
Title
Improved quantum efficiency of InGaAs/InP photodetectors using Ti/Au-SiO2 phase-matched-layer reflector
Author
Jinrong Yuan ; Baile Chen ; Holmes, Archie L.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA
Volume
48
Issue
19
fYear
2012
Firstpage
1230
Lastpage
1232
Abstract
The quantum efficiency of an InGaAs/InP photodetector has increased from 50 to 70.2% at %%1550%nm by applying a Ti/Au reflector with a SiO2 phase-matched-layer at the back of the device. The ultra-broadband mirror has a simple fabrication process and promising reflectivity (97.9% for the reference and 79% for the InGaAs/InP photodetector). These results are comparable to the other more commonly used high-reflectivity mirrors.
Keywords
III-V semiconductors; gallium arsenide; gold; indium compounds; mirrors; optical elements; optical fabrication; photodetectors; reflectivity; silicon compounds; titanium; InGaAs-InP; Ti-Au-SiO2; fabrication process; phase matched layer reflector; photodetectors; quantum efficiency improvement; reflectivity; ultra broadband mirror;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2012.0806
Filename
6317255
Link To Document