DocumentCode :
1304123
Title :
SOI LDMOS with variable-k dielectric trench
Author :
Hu, X.R. ; Zhang, Boming ; Luo, X.R. ; Jiang, Y.H. ; Li, Z.J.
Author_Institution :
Sch. of Microelectron. & Solid-state Electron., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Volume :
48
Issue :
19
fYear :
2012
Firstpage :
1235
Lastpage :
1237
Abstract :
An SOI LDMOS with a variable-k dielectric trench (VKTLDMOS) is proposed. The low-k dielectric on the top of the trench is used to sustain high voltage and ensure the smallest cell pitch while the high-k dielectric on the bottom of the trench increases the average permittivity of the trench and increases the drift doping. The SiO2 dielectric is in the middle of the high-k and low-k materials. Moreover, the SOI TLDMOS with a different k filling dielectric is also discussed. The high-k dielectric is suitable to fill a shallow and wide trench while the low-k dielectric is suitable for a deep and narrow trench. Simulation shows the VKTLDMOS has the highest FOM BV2/Rs,on compared with that of the conventional SOI TLDMOS.
Keywords :
MOSFET; elemental semiconductors; high-k dielectric thin films; low-k dielectric thin films; permittivity; semiconductor doping; silicon compounds; silicon-on-insulator; SOI TLDMOS; SiO2; VKTLDMOS; cell pitch; drift doping; high-k dielectric; k-filling dielectric; low-k dielectric; trench permittivity; variable-k dielectric trench;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2012.1589
Filename :
6317258
Link To Document :
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