DocumentCode
1304179
Title
Guest Editors´ Introduction
Author
Kanoun, Karama ; Pomeranz, Irith
Author_Institution
Electrical and Computer Engineering Department, University of Iowa
Volume
47
Issue
1
fYear
1998
Firstpage
1
Lastpage
1
Keywords
Circuit testing; Computer architecture; Design methodology; Fault tolerant systems; Field programmable gate arrays; Hardware; Maintenance engineering; Reliability engineering; Software reliability; Very large scale integration;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1998.656586
Filename
656586
Link To Document