• DocumentCode
    1304179
  • Title

    Guest Editors´ Introduction

  • Author

    Kanoun, Karama ; Pomeranz, Irith

  • Author_Institution
    Electrical and Computer Engineering Department, University of Iowa
  • Volume
    47
  • Issue
    1
  • fYear
    1998
  • Firstpage
    1
  • Lastpage
    1
  • Keywords
    Circuit testing; Computer architecture; Design methodology; Fault tolerant systems; Field programmable gate arrays; Hardware; Maintenance engineering; Reliability engineering; Software reliability; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1998.656586
  • Filename
    656586