1304179

Guest Editors´ Introduction

Kanoun, Karama ; Pomeranz, Irith

Electrical and Computer Engineering Department, University of Iowa

47

1

1998

1

1

Circuit testing; Computer architecture; Design methodology; Fault tolerant systems; Field programmable gate arrays; Hardware; Maintenance engineering; Reliability engineering; Software reliability; Very large scale integration;

English

Computers, IEEE Transactions on

ieee

0018-9340

jour

10.1109/TC.1998.656586

656586